Welcome to Wuhan Yoha Solar Technology Co., Ltd!
common problem
Site Map
Language:
Chinese
English
Welcome to Wuhan Yoha Solar Technology Co., Ltd!
common problem
Site Map
Language:
Chinese
English
| Brand: | YOHA Solar |
| Model: | YHMT-1590 |
| Unit: | unit |
The Solar Mini-Module IV Tester is a professional testing instrument that utilizes pulsed light sources to simulate Standard Test Conditions (STC). It is specifically designed for the rapid and precise measurement of the current-voltage (IV) characteristic curves of single cells, single cell strings, small modules, or samples. It automatically calculates key performance parameters (such as open-circuit voltage Voc, short-circuit current Isc, maximum power Pmax, fill factor FF, conversion efficiency, etc.) and features module grading capabilities. Widely used in R&D laboratories, production line quality control, incoming material inspection, and failure analysis.
Accurate and Efficient Pulsed Testing: Employs high-precision pulsed light sources to instantly simulate STC, completing an IV characteristic measurement within milliseconds. Minimizes the impact of temperature rise on the test sample, ensuring the accuracy and repeatability of measurement results (Voc, Isc, Pmax, FF, efficiency, etc.).
Fully Automated Measurement & Data Analysis: Initiates IV curve scanning and data collection automatically with a single button press. Built-in algorithms calculate all key performance parameters in real-time and generate test reports automatically, significantly improving testing efficiency and reducing manual errors. Ideal for high-speed production line inspection.
Intelligent Grading & Data Management: Features preset standards or customizable parameter thresholds. Automatically grades small modules (e.g., Grade A, Grade B) or performs pass/fail judgments based on test results (e.g., power, efficiency). Supports data storage, traceability, export, and networked management for convenient quality control and statistical analysis.
Wide Compatibility & Flexibility: Designed for various small photovoltaic components, including mono/polycrystalline silicon cells/modules. Flexible and easy-to-use fixture design caters to diverse testing needs in R&D, laboratories, production line QC, incoming inspection, and failure analysis.
| Item | Parameter |
|---|---|
| Model | YHMT-1590 |
| Light Source | Complies with IEC 60904-9:2020 Spectral Requirements (Class A) |
| Spectral Range | 300~1200nm |
| Irradiance | 1000W/m² (Adjustable 200~1200W/m²) |
| Irradiance Non-uniformity | ≤2% (Class A) |
| Irradiance Instability | ≤2% (Class A) |
| Test Result Consistency | ≤1% |
| Electrical Measurement Error | ≤2% |
| Single Flash Pulse Width | 10ms |
| Effective Test Area | 1500*900mm |
| Power Supply | 220V/50HZ |
1. Supporting PV R&D Innovation: Used for rapid evaluation of the electrical performance (IV curve and parameters like Voc, Isc, Pmax) of new materials, new cell structures (e.g., shingled, half-cut cells), or process samples, providing critical data support for technology optimization and product design.
2. Ensuring Production Line Quality & Efficiency: Performs online/offline inspection at key processes like cell sorting, string soldering, and mini-module lamination. Quickly screens out defective products and enables automatic power binning to ensure product consistency and production yield.
3. Strict Incoming Material Quality Control: Conducts incoming inspection for purchased cells, single strings, or small samples. Verifies supplier specifications (especially power and efficiency), preventing substandard raw materials from entering production and reducing downstream risks.
4. Diagnosing Module Failure & Reliability: Used to analyze performance degradation reasons for modules after aging tests (e.g., damp heat, PID) or field failures. Pinpoints failure modes (e.g., resistive degradation, active area loss) by comparing IV curve changes, guiding product improvement.
1. Strictly Adhere to Light Source Safety Protocols: The high-energy, high-brightness light pulses emitted by the device are hazardous. Never look directly at the light source or open the test chamber door during operation.
2. Ensure Proper Grounding & Electrical Isolation: The device involves high voltage and high current output. It must be reliably grounded, connected to a power supply meeting specifications, and cables should be inspected regularly for insulation integrity.
3. Precisely Control Test Environment Temperature & Humidity: Module performance is significantly affected by temperature. Pre-condition modules to the set temperature (typically 25°C ±1°C) before testing, using calibrated contact sensors for real-time surface temperature monitoring. Control ambient humidity within the specified range (typically <60% RH) to prevent condensation or high-voltage discharge risks.
4. Use Test Fixtures Correctly: Clean test fixtures regularly to prevent oxidation and ensure good contact. Poor contact can cause measurement errors or localized overheating damaging the component.
5. Regular Calibration & Maintenance of Core Components: Calibrate core metrology units - light source intensity (irradiance uniformity, stability), current/voltage sensor accuracy, and temperature probes - regularly according to standards (e.g., IEC 60904 series). Maintain optical components (clean lenses/reflectors) and mechanical movement mechanisms to ensure stable and reliable device performance.
6. Follow Standard Operating Procedures & Parameter Settings: Input accurate module parameters (e.g., nominal power, type) before testing. Set pulse width and voltage intensity carefully to avoid irreversible thermal damage from excessively long/strong pulses (especially for thin or temperature-sensitive materials). Allow modules to cool sufficiently after testing before the next test or removal. Investigate environmental factors, contact issues, and device status when encountering abnormal data; never arbitrarily alter or ignore abnormal results.
TOP
18086473422
MESSAGE
